Beilstein J. Nanotechnol.2017,8, 514–521, doi:10.3762/bjnano.8.55
-oxideelectronics; X-ray photoelectron spectroscopy (XPS); Introduction
For many years, tin dioxide (SnO2) has been widely used as the active material for resistive-type gas sensors for oxidizing and reducing gases [1], thin transparent electrodes and barrier layers in solar cells [2]. This is related
the distance between the valence band edge and the Fermi level energy. This was attributed to oxygen diffusion through the porous SnO2 surface as measured by atomic force microscopy.
Keywords: Fermi level position; RGVO nanolayers; rheotaxial growth and vacuum oxidation (RGVO); surface chemistry; tin
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Figure 1:
XPS survey spectra with the main core-level lines of RGVO SnO2 nanolayers (pristine (“in situ”), af...